Multiresolution texture analysis of surface reflection images

Authors:
Leena Lepistö;Iivari Kunttu;Jorma Autio;Ari Visa
Affiliations:
Tampere University of Technology, Institute of Signal Processing, Tampere, Finland;Tampere University of Technology, Institute of Signal Processing, Tampere, Finland;Saanio & Riekkola Consulting Engineers, Helsinki, Finland;Tampere University of Technology, Institute of Signal Processing, Tampere, Finland
Venue:
SCIA'03 Proceedings of the 13th Scandinavian conference on Image analysis
Year:
2003

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Abstract

Surface reflection can be used as one quality assurance procedure to inspect the defects, cracking, and other irregularities occurring on a polished surface. In this paper, we present a novel approach to the detection of defects based on analysis of surface reflection images. In this approach, the surface image is analyzed using texture analysis based on Gabor-filtering. Gabor-filters can be used in the inspection of the surface in multiple resolutions, which makes it possible to inspect the defects of different sizes. The orientation of the defects and surface cracking is measured by applying the Gabor-filters in several orientations. A set of experiments were carried out by using surface reflection images of polished rock plates and the orientation of the surface cracking was determined. In addition, the homogeneity of the rock surface was measured based on the Gabor features. The results of the experiments show that Gabor features are effective in the measurement of the surface properties.