Bidimensional empirical mode decomposition modified for texture analysis

Authors:
J. C. Nunes;O. Niang;Y. Bouaoune;E. Delechelle;Ph. Bunel
Affiliations:
Laboratoire d'Etude et de Recherche en Instrumentation, Signaux et Systèmes, Université Paris XII, Creteil Cedex, France;Laboratoire d'Etude et de Recherche en Instrumentation, Signaux et Systèmes, Université Paris XII, Creteil Cedex, France;Laboratoire d'Etude et de Recherche en Instrumentation, Signaux et Systèmes, Université Paris XII, Creteil Cedex, France;Laboratoire d'Etude et de Recherche en Instrumentation, Signaux et Systèmes, Université Paris XII, Creteil Cedex, France;Laboratoire d'Etude et de Recherche en Instrumentation, Signaux et Systèmes, Université Paris XII, Creteil Cedex, France
Venue:
SCIA'03 Proceedings of the 13th Scandinavian conference on Image analysis
Year:
2003

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Abstract

This study introduces a new approach based on Bidimensional Empirical Mode Decomposition (BEMD) to extract texture features at multiple scales or spatial frequencies. Moreover, it can resolve the intrawave frequency modulation provided the frequency modulation. This decomposition, obtained by the bidimensional sifting process, plays an important role in the characterization of regions in textured images. The sifting process is realized using morphological operators to analyze the spatial frequencies and thanks to radial basis functions (RBF) for surface interpolation. We modified the original sifting algorithm to permit a pseudo bandpass decomposition of images by inserting scale criterion. Its effectiveness is demonstrated on synthetic and natural textures. In particular, we show that many different elements in textures can be extracted through the bidimensional empirical mode decomposition, which is fully unsupervised.