Registration of seal images using contour analysis

Authors:
Yung-Sheng Chen
Affiliations:
Department of Electrical Engineering, Yuan Ze University, Chung-Li, Taiwan ROC
Venue:
SCIA'03 Proceedings of the 13th Scandinavian conference on Image analysis
Year:
2003

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Abstract

Many types of noise can be present in an image. Registration becomes difficult when the concerned pattern contains a "seal noise." In this paper, the seal noise appearing inherently in a seal image is introduced. The registration of seal images used widely in many commercial applications in Chinese society is presented. An effective approach using contour analysis for finding the principal orientation of a seal image is developed for the registration task. Three types of seal image of the author's own are used for exper iments, and results obtained by a moment-based method are given for comparison.