A paradigm for metric based inspection process for enhancing defect management

Authors:
T.R. Gopalakrishnan Nair;V. Suma
Affiliations:
RIIC, Dayananda Sagar Institutions, Bangalore, India;RIIC, Dayananda Sagar Institutions, Bangalore, India
Venue:
ACM SIGSOFT Software Engineering Notes
Year:
2010

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Abstract

Inspection process in software development plays a vital role in effective defect management. In order to have an appropriate measurement of the inspection process, we depend on a process metric called the Depth of Inspection (DI). DI enables the manager within the software community to identify and compare the level of inspection performed in various projects. An empirical study of several projects facilitated the evaluation of a set of process coefficients which are capable of predicting the DI values using multiple regression models. The industry observed DI value based on defect count and the DI value produced by the model are strongly matching. This supports the predictive capability of DI through process coefficients without depending on the prior estimation of the defect count.