Unsupervised Feature Selection Using Feature Similarity
IEEE Transactions on Pattern Analysis and Machine Intelligence
ICCV '03 Proceedings of the Ninth IEEE International Conference on Computer Vision - Volume 2
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This paper presents a fast multispectral texture defect detection method based on the underlying three-dimensional spatial probabilistic image model. The model first adaptively learns its parameters on the flawless texture part and subsequently checks for texture defects using the recursive prediction analysis. We provide colour textile defect detection results that indicate the advantages of the proposed method.