Texture defect detection

  • Authors:
  • Michal Haindl;Jiří Grim;Stanislav Mikeš

  • Affiliations:
  • Institute of Information Theory and Automation, Academy of Sciences CR, Prague, Czech Republic;Institute of Information Theory and Automation, Academy of Sciences CR, Prague, Czech Republic;Institute of Information Theory and Automation, Academy of Sciences CR, Prague, Czech Republic

  • Venue:
  • CAIP'07 Proceedings of the 12th international conference on Computer analysis of images and patterns
  • Year:
  • 2007

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Abstract

This paper presents a fast multispectral texture defect detection method based on the underlying three-dimensional spatial probabilistic image model. The model first adaptively learns its parameters on the flawless texture part and subsequently checks for texture defects using the recursive prediction analysis. We provide colour textile defect detection results that indicate the advantages of the proposed method.