Unambiguous dynamic diffraction patterns for 3D depth profile measurement

Authors:
Dominik Lubeley
Affiliations:
Communication Technology Institute, University of Dortmund, Germany
Venue:
Proceedings of the 29th DAGM conference on Pattern recognition
Year:
2007

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Abstract

The projection of fixed patterns in active 3d measurement systems is deteriorated by ambient lighting. Moreover classic projection patterns lead to ambiguities during pattern detection in the digital signal processing phase. Therefore a dynamic, diffraction based pattern projection system is introduced which can adapt to ambient lighting conditions. For error-free laser pattern detection a method for the design of unambiguous projection patterns is presented.