Dual analysis for proving safety and finding bugs

  • Authors:
  • Corneliu Popeea;Wei-Ngan Chin

  • Affiliations:
  • Max Planck Institute for Software Systems (MPI-SWS);National University of Singapore

  • Venue:
  • Proceedings of the 2010 ACM Symposium on Applied Computing
  • Year:
  • 2010

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Abstract

Program bugs remain a major challenge for software developers and various tools have been proposed to help with their localization and elimination. Most present-day tools are based either on over-approximating techniques that can prove safety but may report false positives, or on under-approximating techniques that can find real bugs but with possible false negatives. In this paper, we propose a dual static analysis that is based on only over-approximation. Its main novelty is to concurrently derive conditions that lead to either success or failure outcomes and thus we provide a comprehensive solution for both proving safety and finding real program bugs. We have proven the soundness of our approach and have implemented a prototype system that is validated by a set of experiments.