Semi-automated diagnosis of FODA feature diagram

  • Authors:
  • Shin Nakajima

  • Affiliations:
  • National Institute of Informatics, Chiyoda-Ku Tokyo, Japan

  • Venue:
  • Proceedings of the 2010 ACM Symposium on Applied Computing
  • Year:
  • 2010

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Abstract

A semi-automated model diagnostic method is proposed for FODA feature diagram, a primary modeling notation used in Software Product Line Engineering. The proposed method includes a propositional logic interpretation of the feature diagram and a diagram-slicing algorithm for locating bugs. In addition to logic-based formalization of the semantics, the novelty of our approach is that it uses heuristics taking into account the diagram graph structure. Although human intelligence is always involved in removing bugs from feature diagrams, the checking and diagnosing of them can be automated to some extent.