Monitoring nonlinear profiles using support vector machines

  • Authors:
  • Javier M. Moguerza;Alberto Muñoz;Stelios Psarakis

  • Affiliations:
  • University Rey Juan Carlos, Fuenlabrada, Spain;University Carlos III, Getafe, Spain;Athens Univ. of Econ. and Business, Athens, Greece

  • Venue:
  • CIARP'07 Proceedings of the Congress on pattern recognition 12th Iberoamerican conference on Progress in pattern recognition, image analysis and applications
  • Year:
  • 2007

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Abstract

In this work we focus on the use of SVMs for monitoring techniques applied to nonlinear profiles in the Statistical Process Control (SPC) framework. We develop a new methodology based on Functional Data Analysis for the construction of control limits for nonlinear profiles. In particular, we monitor the fitted curves themselves instead of monitoring the parameters of any model fitting the curves. The simplicity and effectiveness of the data analysis method has been tested against other statistical approaches using a standard data set in the process control literature.