Visualization of the critical patterns of missing values in classification data

Authors:
Hai Wang;Shouhong Wang
Affiliations:
Sobey School of Business, Saint Mary's University, Canada;Charlton College of Business, University of Massachusetts Dartmouth
Venue:
VISUAL'07 Proceedings of the 9th international conference on Advances in visual information systems
Year:
2007

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Abstract

The patterns of missing values are important for assessing the quality of a classification data set and the validation of classification results. The paper discusses the critical patterns of missing values in a classification data set: missing at random, uneven symmetric missing, and uneven asymmetric missing. It proposes a self-organizing maps (SOM) based cluster analysis method to visualize the patterns of missing values in classification data.