A cross-platform test system for evolutionary black-box testing of embedded systems

  • Authors:
  • Peter M. Kruse;Joachim Wegener;Stefan Wappler

  • Affiliations:
  • Berner & Mattner Systemtechnik GmbH, Berlin, Germany;Berner & Mattner Systemtechnik GmbH, Berlin, Germany;Berner & Mattner Systemtechnik GmbH, Berlin, Germany

  • Venue:
  • ACM SIGEVOlution
  • Year:
  • 2010

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Abstract

When developing an electronic control unit (ECU) in a domain like the automotive industry, tests are performed on several test platforms, such as model-in-the-loop, software-in-the-loop and hardware-in-the-loop in order to find faults in early development stages. Test cases must be specified to verify the properties demanded of the developed system on these platforms. This is an expensive and non-trivial task. Evolutionary black-box testing, a recent approach to test case generation, can perform this task completely automatically. This paper describes our test system that implements evolutionary black-box testing and how to apply it to test functional and non-functional properties of an embedded system. Our test system supports the aforementioned test platforms and allows reuse of the generated test cases across them. We demonstrate the functioning of the test system in a case study with an antilock braking system.