A novel model for simulation of RF oscillator phase noise

Authors:
Siamak Yousefi;Thomas Eriksson;Dan Kuylenstierna
Affiliations:
Department of Signals an Systems, Chalmers University of Technology, Gothenburg, Sweden;Department of Signals an Systems, Chalmers University of Technology, Gothenburg, Sweden;Department of MC2, Chalmers University of Technology, Gothenburg, Sweden
Venue:
RWS'10 Proceedings of the 2010 IEEE conference on Radio and wireless symposium
Year:
2010

Citing 2
Cited 0

A Generalized Method for Computing Oscillator Phase Noise Spectra

Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Phase Noise Spectral Limits in OFDM Systems

Wireless Personal Communications: An International Journal

Quantified Score

Hi-index	0.00

Visualization

Abstract

A novel model of the RF oscillator's phase noise process has been provided in this work, resulting in a more accurate model than the conventional Wiener process. The phase noise is considered as the integration of frequency noise which consists of white and flicker noise, whereas the Wiener process is the integration result of white noise only. Analytical expressions of the oscillator RMS jitter and the Single-Side Band (SSB) phase noise (L) are presented and compared to the simulation and measurement results for verification. The relationship between 1/f3-1/f2 corner frequency in the PSD and the slope transition corner in RMS jitter plot is consistent with the analytical and measurement results. The simulation result shows that the PSD of the oscillator becomes Gaussian close to the carrier, followed by power-law regions, in consistense with the analytical expression.