A resistant learning procedure for coping with outliers

  • Authors:
  • Rua-Huan Tsaih;Tsung-Chi Cheng

  • Affiliations:
  • Department of Management Information Systems, National Chengchi University, Taipei, Taiwan;Department of Statistics, National Chengchi University, Taipei, Taiwan

  • Venue:
  • Annals of Mathematics and Artificial Intelligence
  • Year:
  • 2009

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Abstract

In the context of resistant learning, outliers are the observations far away from the fitting function that is deduced from a subset of the given observations and whose form is adaptable during the process. This study presents a resistant learning procedure for coping with outliers via single-hidden layer feed-forward neural network (SLFN). The smallest trimmed sum of squared residuals principle is adopted as the guidance of the proposed procedure, and key mechanisms are: an analysis mechanism that excludes any potential outliers at early stages of the process, a modeling mechanism that deduces enough hidden nodes for fitting the reference observations, an estimating mechanism that tunes the associated weights of SLFN, and a deletion diagnostics mechanism that checks to see if the resulted SLFN is stable. The lake data set is used to demonstrate the resistant-learning performance of the proposed procedure.