Monitoring Software Quality Evolution for Defects

  • Authors:
  • Hongyu Zhang;Sunghun Kim

  • Affiliations:
  • Tsinghua University, Beijing;Hong Kong University of Science and Technology, Hong Kong

  • Venue:
  • IEEE Software
  • Year:
  • 2010

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Abstract

Quality control charts, especially c-charts, can help monitor software quality evolution for defects over time. c-charts of the Eclipse and Gnome systems showed that for systems experiencing active maintenance and updates, quality evolution is complicated and dynamic. The authors identify six quality evolution patterns and describe their implications. Quality assurance teams can use c-charts and patterns to monitor quality evolution and prioritize their efforts.