A test pattern selection method for a joint bounded-distance and encoding-based decoding algorithm of binary codes

  • Authors:
  • Hitoshi Tokushige;Marc P. C. Fossorier;Tadao Kasami

  • Affiliations:
  • University of Tokushima;ETIS ENSEA/UCP/CNRS UMR;Nara Institute of Science and Technology

  • Venue:
  • IEEE Transactions on Communications
  • Year:
  • 2010

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Abstract

For binary linear block codes, this letter deals with a class of decoding algorithms which utilize bounded-distance and encoding-based decodings with input sequences that are calculated from a received sequence and given test patterns. We propose a new method for selecting the test patterns by simulation. The effectiveness of the decoding algorithm whose test patterns are selected by the proposed method is also shown by simulation.