Microwave transistor amplifiers (2nd ed.): analysis and design
Microwave transistor amplifiers (2nd ed.): analysis and design
Microelectronic Engineering
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Plasma impedance monitoring (PIM) based on electrical measurements is successfully used as an alternative to determine real time detection endpoint during plasma etching of structured bulk materials. In this paper we present the results with this technique for the endpoint detection during the etching of various materials. The endpoint conditions are tested in the sixth harmonic components of the electrical plasma parameters with an RF sensor. The endpoint is determined when an electrical parameter transition is observed. This transition corresponds to the change of the total reactor impedance, and allows the etching of the doped layer to stop on the bulk substrate. Using a Smith chart we determine the best harmonics/electrical monitoring couple parameters for processes on various materials. Resistivity measurements are used before and after etching in order to confirm the usefulness of the PIM method. In this paper, we also demonstrate how to monitor a real time control of non-uniformity during the reactive ion etching (RIE) process in the case of gallium arsenide etching.