Automatic detection of wheat flour precision based on Image processing

  • Authors:

  • Liu YanLi;Zhang HongMei;Wang TieJian

  • Affiliations:

  • Department of information science and technology, Henan University of Technology, Zhengzhou, China;Department of information science and technology, Henan University of Technology, Zhengzhou, China;Department of information engineering, Chenggong College of Henan, University of Finance and Economics, Zhengzhou, China

  • Venue:
  • CAR'10 Proceedings of the 2nd international Asia conference on Informatics in control, automation and robotics - Volume 1
  • Year:
  • 2010

Quantified Score

Hi-index 0.00

Visualization

Abstract

In order to efficient, objective and comprehensive assessment of wheat flour processing accuracy, this paper introduces a new method to detect the wheat flour processing precision; it uses wheat flour three features of Whiteness, color, bran to design classifiers. The 240 different accuracy wheat sample images were analyzed and tested, experimental results show that CIE L*a*b*and OTSU algorithm can effectively extract of wheat color features and content of bran, classifier also achieves the expected effect.