Active Testing for Face Detection and Localization

Authors:
Raphael Sznitman;Bruno Jedynak
Affiliations:
The Johns Hopkins University, Baltimore, MD;The Johns Hopkins University, Baltimore, MD and Institut Universitaire de Technologie, Lille, France
Venue:
IEEE Transactions on Pattern Analysis and Machine Intelligence
Year:
2010

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Abstract

We provide a novel search technique which uses a hierarchical model and a mutual information gain heuristic to efficiently prune the search space when localizing faces in images. We show exponential gains in computation over traditional sliding window approaches, while keeping similar performance levels.