Affine moment invariants: a new tool for character recognition
Pattern Recognition Letters
Two-dimensional imaging
Deformation invariants in object recognition
Computer Vision and Image Understanding
Robust image matching under partial occlusion and spatially varying illumination change
Computer Vision and Image Understanding - Special issue on robusst statistical techniques in image understanding
Simplified Approach to Image Processing: Classical and Modern Techniques in C
Simplified Approach to Image Processing: Classical and Modern Techniques in C
Affine Invariant Pattern Recognition Using Multiscale Autoconvolution
IEEE Transactions on Pattern Analysis and Machine Intelligence
Computationally efficient wavelet affine invariant functions for shape recognition
IEEE Transactions on Pattern Analysis and Machine Intelligence
Automatic measuring system for railroad wheels
International Journal of Computer Applications in Technology
Adaptive method for improvement of human skin detection in colour images
International Journal of Computer Applications in Technology
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This study proposes a simple and fast technique for detecting wafer cutting lines using the Affine transformation before sawing. This technique was developed for the purpose of wafer alignment when alignment marks are unavailable. The edges of the pre-sawing lines are complex and there are bright shapes in the sawing lines, so it is difficult to apply the conventional edge finding method. The sawing lines are represented by rectangular windows which are deformed by an Affine transformation. The amount of deformation is determined when the grey level in the window is a global minimum in the image. The global minimum is found by the golden section search. The algorithm was tested using 13 sample images and repeated ten times for each image. The results showed that the processing time was below 1200 ms and the deviation was in the sub-pixel level. We found that the proposed method can be applied to align wafers in the dicing process.