Dynamic hierarchical mega models: comprehensive traceability and its efficient maintenance

  • Authors:

  • Andreas Seibel;Stefan Neumann;Holger Giese

  • Affiliations:

  • Hasso Plattner Institute, University of Potsdam, Potsdam, Germany;Hasso Plattner Institute, University of Potsdam, Potsdam, Germany;Hasso Plattner Institute, University of Potsdam, Potsdam, Germany

  • Venue:
  • Software and Systems Modeling (SoSyM)
  • Year:
  • 2010

Quantified Score

Hi-index 0.00

Visualization

Abstract

In the world of model-driven engineering (MDE) support for traceability and maintenance of traceability information is essential. On the one hand, classical traceability approaches for MDE address this need by supporting automated creation of traceability information on the model element level. On the other hand, global model management approaches manually capture traceability information on the model level. However, there is currently no approach that supports comprehensive traceability, comprising traceability information on both levels, and efficient maintenance of traceability information, which requires a high-degree of automation and scalability. In this article, we present a comprehensive traceability approach that combines classical traceability approaches for MDE and global model management in form of dynamic hierarchical mega models. We further integrate efficient maintenance of traceability information based on top of dynamic hierarchical mega models. The proposed approach is further outlined by using an industrial case study and by presenting an implementation of the concepts in form of a prototype.