Wavelet-based directional structural distortion model for image quality assessment

Authors:
G. Cheng;Lizhi Cheng;Ying Li
Affiliations:
School of Science, National University of Defense Technology, Changsha, Hunan, China 410073 and Department of Mathematics, National University of Singapore, Singapore, Singapore 117543;School of Science, National University of Defense Technology, Changsha, Hunan, China 410073;School of Science, National University of Defense Technology, Changsha, Hunan, China 410073
Venue:
Pattern Recognition and Image Analysis
Year:
2010

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Abstract

It is a challenging work to find an efficient metric of image quality assessment, which is an important problem for many image processing tasks. In this paper, we propose a novel wavelet-based directional structural distortion model for image quality assessment, which explores the geometric structural features of natural image. The experimental results upon image database show that our proposed method is in accordance with characteristic of human visual system and has better consistency with the subjective assessment of human beings than current image quality assessment algorithms.