Error Tolerance of DNA Self-Healing Assemblies by Puncturing
DFT '07 Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Checkpointing of Rectilinear Growth in DNA Self-Assembly
DFT '08 Proceedings of the 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems
Coded DNA Self-Assembly for Error Detection/Location
DFT '09 Proceedings of the 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Manufacturing yield of QCA circuits by synthesized DNA self-assembled templates
Proceedings of the 20th symposium on Great lakes symposium on VLSI
A coding framework for DNA self-assembly
NANOARCH '09 Proceedings of the 2009 IEEE/ACM International Symposium on Nanoscale Architectures
Complexity of compact proofreading for self-assembled patterns
DNA'05 Proceedings of the 11th international conference on DNA Computing
Error free self-assembly using error prone tiles
DNA'04 Proceedings of the 10th international conference on DNA computing
Compact error-resilient computational DNA tiling assemblies
DNA'04 Proceedings of the 10th international conference on DNA computing
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This brief deals with error detection in deoxyribonucleic acid self-assembly; coding and mapping functions are utilized to assess a correct (error-free) attachment of a tile to a site in the growth process. The proposed approach utilizes the coding/mapping features of the bonds in the tile set by utilizing single and multiple (combined) properties. Properties are combined through an iterative process that considers the aggregate of the intended pattern through coding of the bonds. As a widely used pattern and instantiation of this process, the Sierpinski Triangle self-assembly is analyzed in detail. The properties proposed for the Sierpinski Triangle allow extending single-error detection to the scenario of multiple clustered errors.