HI-C: diagnosing object churn in framework-based applications

Authors:
Marc Fisher, II;Luke Marrs;Barbara G. Ryder
Affiliations:
University of Memphis, Memphis, TN, USA;Virginia Tech, Blacksburg, VA, USA;Virginia Tech, Blacksburg, VA, USA
Venue:
Proceedings of the eighteenth ACM SIGSOFT international symposium on Foundations of software engineering
Year:
2010

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Abstract

In prior work we have developed an escape analysis to help developers identify sources of object churn (i.e., excessive use of temporaries) in large framework-based applications. We have developed Hi-C, an Eclipse plug-in that allows users to visualize, filter, and explore analysis results to aid them in diagnosis of object churn and in program comprehension in general.