Natural Language-Based Approach for Helping in the Reuse of Ontology Design Patterns
EKAW '08 Proceedings of the 16th international conference on Knowledge Engineering: Practice and Patterns
Experiments on pattern-based ontology design
Proceedings of the fifth international conference on Knowledge capture
Ontology design patterns for semantic web content
ISWC'05 Proceedings of the 4th international conference on The Semantic Web
Evaluation of the OQuaRE framework for ontology quality
Expert Systems with Applications: An International Journal
Perception and relevance of quality issues in web vocabularies
Proceedings of the 9th International Conference on Semantic Systems
Hi-index | 0.00 |
The so-called Ontology Design Patterns (ODPs), which have been defined as solutions to ontological design problems, are of great help to developers when modelling ontologies since these patterns provide a development guide and improve the quality of the resulting ontologies. However, it has been demonstrated that, in many cases, developers encounter difficulties when they have to reuse the correct design patterns and include errors in the modelling. Thus, to avoid pitfalls in ontology modelling, this paper proposes classifying errors into two types: (1) errors related to existing ODPs, called anti-patterns, and (2) errors not related to existing ODPs, called pitfalls. This classification is the result of analysing a set of ontologies. This paper is focused on the pitfalls identified during the analysis. In addition the paper presents a classification of the pitfalls found and a set of pitfall examples.