Segmenting point-sampled surfaces

  • Authors:
  • Ichitaro Yamazaki;Vijay Natarajan;Zhaojun Bai;Bernd Hamann

  • Affiliations:
  • University of California, Department of Computer Science, One Shields Avenue, 95616, Davis, CA, USA;Indian Institute of Science, Department of Computer Science and Automation, Supercomputer Education and Research Centre, 560012, Bangalore, India;University of California, Department of Computer Science, One Shields Avenue, 95616, Davis, CA, USA;Institute for Data Analysis and Visualization (IDAV), Department of Computer Science, One Shields Avenue, 95616, Davis, CA, USA

  • Venue:
  • The Visual Computer: International Journal of Computer Graphics
  • Year:
  • 2010

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Abstract

Extracting features from point-based representations of geometric surface models is becoming increasingly important for purposes such as model classification, matching, and exploration. In an earlier paper, we proposed a multiphase segmentation process to identify elongated features in point-sampled surface models without the explicit construction of a mesh or other surface representation. The preliminary results demonstrated the strength and potential of the segmentation process, but the resulting segmentations were still of low quality, and the segmentation process could be slow. In this paper, we describe several algorithmic improvements to overcome the shortcomings of the segmentation process. To demonstrate the improved quality of the segmentation and the superior time efficiency of the new segmentation process, we present segmentation results obtained for various point-sampled surface models. We also discuss an application of our segmentation process to extract ridge-separated features in point-sampled surfaces of CAD models.