Transient behavior of ATM networks under overloads

Authors:
Chang-Yu Wang;Dimitris Logothetis;Kishor S. Trivedi;Ioannis Viniotis
Affiliations:
Dept. of Computer Science, Center for Adv. Computing & Comm., Duke University, Durham, NC;GTE Laboratories Inc., Waltham, MA;Dept. of Electrical Eng., Center for Adv. Computing & Comm., Duke University, Durham, NC;Dept. of Electrical and Computer Eng., Center for Adv. Computing & Comm., North Carolina State University, Raleigh, NC
Venue:
INFOCOM'96 Proceedings of the Fifteenth annual joint conference of the IEEE computer and communications societies conference on The conference on computer communications - Volume 3
Year:
1996

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Abstract

In this paper we characterize the time-dependent behavior of typical queueing systems that arise in ATM networks under the presense of overloads. Transient queue length distribution and transient cell loss probability are obtained numerically and transient characteristics such as maximum overshoot and relaxation time are used to quantify the effects of congestion periods. A new measure, Expected Excess Loss in Overload (EELO) is defined to quantify the effects of overload when compared with the system behavior in the steady-state regime. The basic modeling technology that we use is an extended form of Stochastic Petri nets and a software tool called the Stochastic Petri net package (SPNP).