ECC-on-SIMM test challenges

  • Authors:
  • Timothy J. Dell

  • Affiliations:
  • IBM Microelectronics Division, Essex Junction, Vermont

  • Venue:
  • ITC'94 Proceedings of the 1994 international conference on Test
  • Year:
  • 1994

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Abstract

The typlcal personal computer of today Is used more and more to perform functions and run application programs that are critical to a business's success. One of the biggest problems that inhibits productivity in this environment is the effect of a lock-up, crash or parity error caused by cosmic-ray radiation-induced soft errors in the DRAM chips. IBM has announced a family of plug-compatible, retrofittable SIMMs with built-in ECC to provide a solution to this problem. This paper addresses the challenges associated with the full functional test of a SIMM with on-board ECG using a very test-unfriendly industry-standard memory module interface.