An intelligent software-integrated environment of IC test

Authors:
Yuning Sun;Xiaoming Wang;WanChun Shi
Affiliations:
Institute of Computing Technology, Academia Sinica, Beijing, P.R. China;Institute of Computing Technology, Academia Sinica, Beijing, P.R. China;Institute of Computing Technology, Academia Sinica, Beijing, P.R. China
Venue:
ITC'94 Proceedings of the 1994 international conference on Test
Year:
1994

Citing 3
Cited 0

Object-Oriented Intelligent Computer-Integrated Design, Process Planning, and Inspection

Computer
Using a Test-Specification Format in Automatic Test-Program Generation

IEEE Design & Test
A Flexible Approach to Test Program Cross Compilers

Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner

Quantified Score

Hi-index	0.00

Visualization

Abstract

The migration and simulation of IC (Integrated Circuit) test programs among the heterogeneous ATE systems are a very difficult task. An unifying IC test software-integrated environment from simulation to test for digital circuit has been developed. The environment, TeDS which is designed by using Object-Oriented paradigm, supports two kinds of CAD systems and three kinds of ATE (Automatic Test Equipment). The paper focus on issues and techniques in developing TeDS based on object-oriented paradigm.