Some new techniques in waveshape capture and analysis

  • Authors:

  • Arthur E. Downey;Kazuhiko Matsuda

  • Affiliations:

  • Ando Corporation, Sunnyvale, CA;Ando Electric Co., Ltd., Toyko, Japan

  • Venue:
  • ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
  • Year:
  • 1988

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Abstract

This paper details new techniques for the capture, display and analysis of real-time signals present at the pins of a device under test. Results obtained by the use of these techniques in a new analysis utility are presented.