One-Vs-All Training of Prototype Classifier for Pattern Classification and Retrieval

  • Authors:
  • Cheng-Lin Liu

  • Affiliations:
  • -

  • Venue:
  • ICPR '10 Proceedings of the 2010 20th International Conference on Pattern Recognition
  • Year:
  • 2010

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Abstract

Prototype classifiers trained with multi-class classification objective are inferior in pattern retrieval and outlier rejection. To improve the binary classification (detection, verification, retrieval, outlier rejection) performance of prototype classifiers, we propose a one-vs-all training method, which enriches each prototype as a binary discriminant function with a local threshold, and optimizes both the prototype vectors and the thresholds on training data using a binary classification objective, the cross-entropy (CE). Experimental results on two OCR datasets show that prototype classifiers trained by the one-vs-all method is superior in both multi-class classification and binary classification.