Effect of correlated Nakagami-m fading on the ε-outage channel capacity of the decentralized two-relay network

Authors:
Yifan Chen;Cong Ling
Affiliations:
School of Electrical, Electronic and Computer Engineering, Newcastle University, Newcastle Upon Tyne, United Kingdom and School of Computer, Electronics and Information, Guangxi University, China;Department of Electrical and Electronic Engineering, Imperial College London, London, United Kingdom
Venue:
IEEE Transactions on Wireless Communications
Year:
2010

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Abstract

Using an infinite-series representation of the bivariate Nakagami-m distribution, the cumulative distribution function (cdf) of channel capacity of the decentralized two-relay network (DTRN) is derived. Subsequently, the ε-outage channel capacity can be computed. Based on the theoretical results, we define the forbidden zone of correlation, within which the overall channel capacity is drastically reduced by correlated Nakagami fading. Furthermore, the general expression of the outage capacity is also applicable to any other fading statistics. The analysis presented in this paper should provide useful insight on the placement of cooperative relays in the DTRN.