Reliable and Precise WCET Determination for a Real-Life Processor
EMSOFT '01 Proceedings of the First International Workshop on Embedded Software
The nesC language: A holistic approach to networked embedded systems
PLDI '03 Proceedings of the ACM SIGPLAN 2003 conference on Programming language design and implementation
Unit testing: test early, test often
Journal of Computing Sciences in Colleges
TOSSIM: accurate and scalable simulation of entire TinyOS applications
Proceedings of the 1st international conference on Embedded networked sensor systems
Deadline Analysis of Interrupt-Driven Software
IEEE Transactions on Software Engineering
Using testing and JUnit across the curriculum
Proceedings of the 36th SIGCSE technical symposium on Computer science education
On the Effectiveness of the Test-First Approach to Programming
IEEE Transactions on Software Engineering
Eliminating stack overflow by abstract interpretation
ACM Transactions on Embedded Computing Systems (TECS)
Avrora: scalable sensor network simulation with precise timing
IPSN '05 Proceedings of the 4th international symposium on Information processing in sensor networks
Automatic Derivation of Loop Bounds and Infeasible Paths for WCET Analysis Using Abstract Execution
RTSS '06 Proceedings of the 27th IEEE International Real-Time Systems Symposium
Enhancing Software Testing by Judicious Use of Code Coverage Information
ICSE '07 Proceedings of the 29th international conference on Software Engineering
An experimental laboratory environment for teaching embedded hardware systems
WCAE '07 Proceedings of the 2007 workshop on Computer architecture education
An experimental laboratory environment for teaching embedded operating systems
Proceedings of the 39th SIGCSE technical symposium on Computer science education
Nexos: a next generation embedded systems laboratory
ACM SIGBED Review
WISE: Automated test generation for worst-case complexity
ICSE '09 Proceedings of the 31st International Conference on Software Engineering
Save-IDE - A tool for design, analysis and implementation of component-based embedded systems
ICSE '09 Proceedings of the 31st International Conference on Software Engineering
A regression test selection technique for embedded software
ACM Transactions on Embedded Computing Systems (TECS)
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As embedded systems permeate an ever-widening circle of safety- and mission-critical applications, robust testing of embedded software remains of paramount importance. Yet narrow I/O channels, scarce memory and processor resources, real-time and interrupt-driven behavior, and low-level source languages make state-of-the-art validation techniques much more difficult in an embedded context. For students, for whom testing is often already a secondary concern, the challenges in methodical testing of embedded systems can appear insurmountable. We present the Xinu External Suite Tester (XEST) framework, a tool for automated, parallelized regression testing of embedded software kernels running directly on real embedded hardware. We discuss the requirements for such a system, and evaluate its power as both a quality control mechanism in an actively developing system and as an assessment tool for students in conjunction with the Embedded Xinu experimental laboratory.