Parameter estimation for ridge detection in images with thin structures

Authors:
Talita Perciano;Roberto Hirata, Jr.;Lúcio André De Castro Jorge
Affiliations:
Instituto de Matemática e Estatística, Universidade de São Paulo, São Paulo, SP, Brazil;Instituto de Matemática e Estatística, Universidade de São Paulo, São Paulo, SP, Brazil;CNPDIA, Embrapa Instrumentação Agropecu´aria, São Carlos, SP, Brazil
Venue:
CIARP'10 Proceedings of the 15th Iberoamerican congress conference on Progress in pattern recognition, image analysis, computer vision, and applications
Year:
2010

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Abstract

This paper presents an analysis of four ridge detectors in images with thin structures: plant root images and retinal images. Two proposed detectors and two detectors from the literature are used. We estimate the optimal parameters for each detector for the two applications using a ROC curve similar approach. Simulated images of plant roots and retinal images are used. The optimal parameters are estimated and then used in real images. We conclude that the proposed detector based on mathematical morphology and the one based on the steerable filter are the best for both set of images.