A method for test system diagnostics based on the principles of artificial intelligence

Authors:
A. Jesse Wilkinson
Affiliations:
Teradyne, Inc., Woodland Hills, California
Venue:
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Year:
1984

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Abstract

As VLSI test systems grow more complex, system maintenance becomes an increasing problem. The application of artificial intelligence to test system diagnostics provides the system with the ability to identify the causes of malfunction with speed and accuracy. This automated process has the potential for simplifying system maintenance. The application of the principles of artificial intelligence to test system diagnostics, and the status of this work and its future directions are described.