Improve yield and quality through testability analysis of VLSI circuits

  • Authors:

  • D. M. Wu;C. C. Beh;C. E. Radke

  • Affiliations:

  • IBM General Technology Division, Hopewell Junction, New York;IBM General Technology Division, Hopewell Junction, New York;IBM General Technology Division, Hopewell Junction, New York

  • Venue:
  • ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
  • Year:
  • 1984

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Abstract

A methodology which improves the yield and quality of VLSI circuits is presented and its benefits are demonstrated. Through testability analysis, which is a study of circuits along with their failing behavior under various process defects, modifications of first metal and circuit layout are derived. These modifications can increase both the product yield and improve the product quality.