Robust spatial correlation extraction with limited sample via L1-norm penalty

Authors:
Mingzhi Gao;Zuochang Ye;Dajie Zeng;Yan Wang;Zhiping Yu
Affiliations:
Tsinghua University, Beijing, China;Tsinghua University, Beijing, China;Tsinghua University, Beijing, China;Tsinghua University, Beijing, China;Tsinghua University, Beijing, China
Venue:
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Year:
2011

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Abstract

Random process variations are often composed of location dependent part and distance dependent correlated part. While an accurate extraction of process variation is a prerequisite of both process improvement and circuit performance prediction, it is not an easy task to characterize such complicated spatial random process from a limited number of silicon data. For this purpose, kriging model was introduced to silicon society. This work forms a modified kriging model with L1-norm penalty which offers improved robustness. With the help of Least Angle Regression (LAR) in solving a core optimization sub-problem, this model can be characterized efficiently. Some promising results are presented with numerical experiments where a 3X improvement in model accuracy is shown.