On dependence and discrimination in pattern recognition

  • Authors:
  • Toomas R. Vilmansen

  • Affiliations:
  • Department of Electrical Engineering, University of British Columbia, Vancouver, B. C., Canada

  • Venue:
  • IEEE Transactions on Computers
  • Year:
  • 1972

Quantified Score

Hi-index 14.98

Visualization

Abstract

A new measure of dependence is formulated, and some of its properties are described. The measure is applied to feature evaluation to show the relation of dependence between features and classes to discrimination between class-conditional probability distributions.