EEL: machine-independent executable editing
PLDI '95 Proceedings of the ACM SIGPLAN 1995 conference on Programming language design and implementation
Proceedings of the 29th annual ACM/IEEE international symposium on Microarchitecture
Continuous profiling: where have all the cycles gone?
ACM Transactions on Computer Systems (TOCS)
ProfileMe: hardware support for instruction-level profiling on out-of-order processors
MICRO 30 Proceedings of the 30th annual ACM/IEEE international symposium on Microarchitecture
Proceedings of the 6th international workshop on Hardware/software codesign
All structured programs have small tree width and good register allocation
Information and Computation
A portable sampling-based profiler for Java virtual machines
Proceedings of the ACM 2000 conference on Java Grande
Dynamo: a transparent dynamic optimization system
PLDI '00 Proceedings of the ACM SIGPLAN 2000 conference on Programming language design and implementation
Efficient and flexible value sampling
ACM SIGPLAN Notices
A framework for reducing the cost of instrumented code
Proceedings of the ACM SIGPLAN 2001 conference on Programming language design and implementation
An infrastructure for adaptive dynamic optimization
Proceedings of the international symposium on Code generation and optimization: feedback-directed and runtime optimization
ATOM: a system for building customized program analysis tools
ACM SIGPLAN Notices - Best of PLDI 1979-1999
Demand-driven structural testing with dynamic instrumentation
Proceedings of the 27th international conference on Software engineering
Pin: building customized program analysis tools with dynamic instrumentation
Proceedings of the 2005 ACM SIGPLAN conference on Programming language design and implementation
TraceBack: first fault diagnosis by reconstruction of distributed control flow
Proceedings of the 2005 ACM SIGPLAN conference on Programming language design and implementation
Nonintrusive precision instrumentation of microcontroller software
LCTES '05 Proceedings of the 2005 ACM SIGPLAN/SIGBED conference on Languages, compilers, and tools for embedded systems
Low overhead program monitoring and profiling
PASTE '05 Proceedings of the 6th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering
Sampling-based program locality approximation
Proceedings of the 7th international symposium on Memory management
Sampling-based program execution monitoring
Proceedings of the ACM SIGPLAN/SIGBED 2010 conference on Languages, compilers, and tools for embedded systems
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Debugging is an important phase in the embedded software development cycle because of its high proportion in the overall cost in the product development. Debugging is difficult for real-time applications as such programs are time-sensitive and must meet deadlines in often a resource constrained environment. A common approach for real-time systems is to monitor the execution instead of stepping through the program, because stepping will usually violate all deadline constraints. We consider a sampling-based approach for monitoring, because of its predictable overhead for the system compared to traditional monitoring. However, the sampling-based approach can easily have high overhead depending on the length of branches and the granularity of the monitoring effort. To reduce this overhead, we instrument the program with markers that will permit us to sample less frequently and thus reduce the overhead. This leads to the interesting problems of (a) where to place the markers in the code and (b) how to manipulate the markers. While related work investigates the first part, in this work, we investigate the second component of the problem. We investigate different instrumentation schemes and propose two new schemes based on bitvectors that significantly reduce the overhead for sampling-based execution monitoring.