Effect of additive noise on phase measurement in digital holographic microscopy

  • Authors:

  • Nitesh Pandey;Bryan Hennelly

  • Affiliations:

  • NUI Maynooth, Maynooth, Kildare, Ireland;NUI Maynooth, Maynooth, Kildare, Ireland

  • Venue:
  • 3D Research
  • Year:
  • 2011

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Abstract

Digital holographic microscopy is a quantitative phase measurement technique that can provide nanometer resolution of the thickness or surface profile of an object. We analyze the influence of additive noise in the hologram plane on the accuracy of phase measurement. We analyze Gaussian distributed and Poisson distributed shot noise in the camera plane and we develop a model for quantifying the phase error in the reconstructed phase.