Integration new Apriori algorithm MDNC and six sigma to improve array yield in the TFT-LCD industry

  • Authors:
  • Chiung-Fen Huang;Ruey-Shun Chen

  • Affiliations:
  • Institute of Information Management, Chiao Tung University, Hsinchu, Taiwan, ROC;Institute of Information Management, Chiao Tung University, Hsinchu, Taiwan, ROC

  • Venue:
  • ACOS'06 Proceedings of the 5th WSEAS international conference on Applied computer science
  • Year:
  • 2006

Quantified Score

Hi-index 0.00

Visualization

Abstract

To increase process yield is the most effective way to raise income of TFT-LCD industry. This research is divided into two phases. In the first phase, We have modified Apriori algorithm called Multi-Dimension Non-Continuous (MDNC), an algorithm by eliminating the limitations imposed by traditional pattern matching of continuous data, to mine the association rules in the cross-day discrete manufacturing data and find out some valuable information. The second phase use of MDNC system integrated with six-sigma quality project is set up as the assessment platform which indexes performance and improve performance tracing, to make sure the outcomes of project is profitable enough to reward financial benefit. The preliminary results show the system of new Apriori algorithm techniques integrated with six-sigma methodology is proposed to improve process yield of the Array manufacturing process, the deforming rate of production lines, reduce the cycle time, increase the profit and make the CpK value stable.