Analysis of two dimensional image to obtain unique statistical features for developing image recognition techniques using wavelet approach

  • Authors:
  • A. K. Dubey;A. Q. Ansari;R. P. Singh

  • Affiliations:
  • J. B. Knowledge Park, Faridabad, India;Jamia Millia Islamia University, New Delhi, India;Bimla Devi Educational Society's Group of Institutions, Faridabad, India

  • Venue:
  • Proceedings of the International Conference & Workshop on Emerging Trends in Technology
  • Year:
  • 2011

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Abstract

The Wavelets are mathematical functions. They are used to catch up the data into different frequency components and study the components with a resolution matched to its scale. Wavelets were developed for the fields of mathematics, modern physics, electrical and electronics engineering, and seismic geology. The remarkable developments is being observed in these fields during the last 15 years and have led to many new wavelet applications such as image compression, de-noising, computer vision, automation, automatic visual inspection systems, turbulence, human vision, radar, and earth quake prediction etc. The proposed methodology provides an approach for exploring unique statistical information contained in 2D images, which may further be utilized for developing image recognition techniques.