Self reliability based weighted bit-flipping decoding for low-density parity-check codes

Authors:
Jin Sha;Minglun Gao;Zhongjin Zhang;Li Li;Zhongfeng Wang
Affiliations:
Institute of VLSI design, Key Laboratory of Advanced Photonic and Electronic Materials, Nanjing University, Nanjing, China;Institute of VLSI design, Key Laboratory of Advanced Photonic and Electronic Materials, Nanjing University, Nanjing, China;Institute of VLSI design, Key Laboratory of Advanced Photonic and Electronic Materials, Nanjing University, Nanjing, China;Institute of VLSI design, Key Laboratory of Advanced Photonic and Electronic Materials, Nanjing University, Nanjing, China;School of EECS, Oregon State University, Corvallis, OR
Venue:
IMCAS'06 Proceedings of the 5th WSEAS international conference on Instrumentation, measurement, circuits and systems
Year:
2006

Citing 2
Cited 0

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Abstract

Low Density Parity Check (LDPC) codes can be decoded in various ways, namely the Bit-Flipping (BF) algorithm, the Weighted BF algorithm (WBF), the Belief Propagation (BP) algorithm and so on. These algorithms provide a wide range of tradeoffs among decoding complexity, decoding speed, and error rate performance. In this paper, a novel self-reliability-based weighted bit-flipping decoding scheme for low-density parity-check codes is proposed. Improvement in performance is observed in comparison with the modified weighted bit-flipping decoding scheme, and the decoding complexity can be significantly reduced as well.