Software product-line engineering: a family-based software development process
Software product-line engineering: a family-based software development process
A case study of open source software development: the Apache server
Proceedings of the 22nd international conference on Software engineering
Quantitative Analysis of Faults and Failures in a Complex Software System
IEEE Transactions on Software Engineering
Empirical Analysis of Safety-Critical Anomalies During Operations
IEEE Transactions on Software Engineering
An Empirical Study of Open-Source and Closed-Source Software Products
IEEE Transactions on Software Engineering
Designing Software Product Lines with UML: From Use Cases to Pattern-Based Software Architectures
Designing Software Product Lines with UML: From Use Cases to Pattern-Based Software Architectures
An Empirical Study of Software Reuse vs. Defect-Density and Stability
Proceedings of the 26th International Conference on Software Engineering
Software Product Line Engineering: Foundations, Principles and Techniques
Software Product Line Engineering: Foundations, Principles and Techniques
Mining metrics to predict component failures
Proceedings of the 28th international conference on Software engineering
Predicting Defects for Eclipse
PROMISE '07 Proceedings of the Third International Workshop on Predictor Models in Software Engineering
An empirical investigation of software reuse benefits in a large telecom product
ACM Transactions on Software Engineering and Methodology (TOSEM)
Can data transformation help in the detection of fault-prone modules?
DEFECTS '08 Proceedings of the 2008 workshop on Defects in large software systems
Review: A systematic review of software fault prediction studies
Expert Systems with Applications: An International Journal
Common Trends in Software Fault and Failure Data
IEEE Transactions on Software Engineering
Characterizing and predicting which bugs get fixed: an empirical study of Microsoft Windows
Proceedings of the 32nd ACM/IEEE International Conference on Software Engineering - Volume 1
Defect prediction from static code features: current results, limitations, new approaches
Automated Software Engineering
Software product line engineering for long-lived, sustainable systems
SPLC'10 Proceedings of the 14th international conference on Software product lines: going beyond
Change Bursts as Defect Predictors
ISSRE '10 Proceedings of the 2010 IEEE 21st International Symposium on Software Reliability Engineering
Results and experiences from an empirical study of fault reports in industrial projects
PROFES'06 Proceedings of the 7th international conference on Product-Focused Software Process Improvement
Are change metrics good predictors for an evolving software product line?
Proceedings of the 7th International Conference on Predictive Models in Software Engineering
Hi-index | 0.00 |
Reliability is important to software product-line developers since many product lines require reliable operation. It is typically assumed that as a software product line matures, its reliability improves. Since post-deployment failures impact reliability, we study this claim on an open-source software product line, Eclipse. We investigate the failure trend of common components (reused across all products), highreuse variation components (reused in five or six products) and low-reuse variation components (reused in one or two products) as Eclipse evolves. We also study how much the common and variation components change over time both in terms of addition of new files and modification of existing files. Quantitative results from mining and analysis of the Eclipse bug and release repositories show that as the product line evolves, fewer serious failures occur in components implementing commonality, and that these components also exhibit less change over time. These results were roughly as expected. However, contrary to expectation, components implementing variations, even when reused in five or more products, continue to evolve fairly rapidly. Perhaps as a result, the number of severe failures in variation components shows no uniform pattern of decrease over time. The paper describes and discusses this and related results.