IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
An intelligent BIST mechanism for MEMS fault detection
CA '07 Proceedings of the Ninth IASTED International Conference on Control and Applications
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There are different methods for detecting digital faults in electronic and computer systems. But for analog faults, there are some problems. This kind of faults consist of many different and parametric faults, which can not be detected by digital fault detection methods. One of the proposed methods for analog fault detection, is neural networks. Fault detection is actually a pattern recognition task. Faulty and fault free data are different patterns which must be recognized. In this paper we use a probabilistic neural network to recognize different faults(patterns) in analog systems. A fuzzy system is used to improve performance of network. Finally different network results are compared.