Evolving a test oracle in black-box testing

  • Authors:
  • Farn Wang;Jung-Hsuan Wu;Chung-Hao Huang;Kai-Hsiang Chang

  • Affiliations:
  • Dept. of Electrical Engineering, Graduate Institute of Electronic Engineering, National Taiwan University, Taiwan, ROC;Dept. of Electrical Engineering, National Taiwan University, Taiwan, ROC;Dept. of Electrical Engineering, Graduate Institute of Electronic Engineering, National Taiwan University, Taiwan, ROC;Dept. of Electrical Engineering, National Taiwan University, Taiwan, ROC

  • Venue:
  • FASE'11/ETAPS'11 Proceedings of the 14th international conference on Fundamental approaches to software engineering: part of the joint European conferences on theory and practice of software
  • Year:
  • 2011

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Abstract

Software testing is an important and expensive activity to the software industry, with testing accounting for over 50% of the cost of software. To ease this problem, test automation is very critical to the process of software testing. One important issue in this automation is to automatically determine whether a program under test (PUT) responds the correct(expected) output for an arbitrary input. In this paper, we model PUTs in black-box way, i.e. processing and responding a list of numbers, and design input/output list relation language(IOLRL) to formally describe the relations between the input and output lists. Given several labelled test cases(test verdicts are set), we use genetic programming to evolve the most distinguishing relations of these test cases in IOLRL and encode the test cases into bit patterns to build a classifier with support vector machine as the constructed test oracle. This classifier can be used to automatically verify if a program output list is the expected one in processing a program input list. The main contribution of this work are the designed IOLRL and the approach to construct test oracle with evolve relations in IOLRL. The experiments show the constructed test oracle has good performance even when few labelled test cases are supplied.