Mixture control chart patterns recognition using independent component analysis and support vector machine

Authors:
Chi-Jie Lu;Yuehjen E. Shao;Po-Hsun Li
Affiliations:
Department of Industrial Engineering and Management, Ching Yun University, Jung-Li 320 Taoyuan, Taiwan, ROC;Department of Statistics and Information Science, Fu Jen Catholic University, Hsinchuang, Taipei County 242, Taiwan, ROC;Graduate Institute of Applied Statistics, Fu Jen Catholic University, Hsinchuang, Taipei County 242, Taiwan, ROC
Venue:
Neurocomputing
Year:
2011

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Abstract

Effective recognition of control chart patterns (CCPs) is an important issue since abnormal patterns exhibited in control charts can be associated with certain assignable causes which affect the process. Most of the existing studies assume that the observed process data which needs to be recognized are basic types of abnormal CCPs. However, in practical situations, the observed process data could be mixture patterns, which consist of two basic CCPs combined together. In this study, a hybrid scheme using independent component analysis (ICA) and support vector machine (SVM) is proposed for CCPs recognition. The proposed hybrid ICA-SVM scheme initially applies an ICA to the mixture patterns in order to generate independent components (ICs). The hidden basic patterns of the mixture patterns can be discovered in these ICs. The ICs can then serve as the input variables of the SVM for building a CCP recognition model. Experimental results revealed that the proposed scheme is able to effectively recognize mixture control chart patterns and outperform the single SVM models, which did not use an ICA as a preprocessor.