Nonlinear component analysis as a kernel eigenvalue problem
Neural Computation
Expert Systems with Applications: An International Journal
Image compression scheme based on curvelet transform and support vector machine
Expert Systems with Applications: An International Journal
Properties of Savitzky--Golay digital differentiators
Digital Signal Processing
A comparison of multi-resolution methods for detection and isolation of pavement distress
Expert Systems with Applications: An International Journal
SVM practical industrial application for mechanical faults diagnostic
Expert Systems with Applications: An International Journal
The curvelet transform for image denoising
IEEE Transactions on Image Processing
On feature selection with principal component analysis for one-class SVM
Pattern Recognition Letters
Expert Systems with Applications: An International Journal
Expert Systems with Applications: An International Journal
Hi-index | 12.05 |
Indicator diagram plays an important role in the health monitoring and fault diagnosis of reciprocating compressors. Different shapes of indicator diagram indicate different faults of reciprocating compressor. A proper feature extraction and pattern recognition method for indicator diagram is significant for practical uses. In this paper, a novel approach is presented to handle the multi-class indicator diagrams recognition and novelty detection problems. When multi-class faults samples are available, this approach implements multi-class fault recognition; otherwise, the novelty detection is implemented. In this approach, the discrete 2D-Curvelet transform is adopted to extract the representative features of indicator diagram, nonlinear PCA is employed for multi-class recognition to reduce dimensionality, and PCA is used for novelty detection. Finally, multi-class and one-class support vector machines (SVMs) are used as the classifier and novelty detector respectively. Experimental results showed that the performance of the proposed approach is better than the traditional wavelet-based approach.