Modeling ion trap thermal noise decoherence

  • Authors:
  • David Leibrandt;Bernard Yurke;Richart Slusher

  • Affiliations:
  • Department of Physics, Massachusetts Institute of Technology, Cambridge, MA and Lucent Technologies, Bell Laboratories, Murray Hill, NJ;Lucent Technologies, Bell Laboratories, Murray Hill, NJ;Lucent Technologies, Bell Laboratories, Murray Hill, NJ

  • Venue:
  • Quantum Information & Computation
  • Year:
  • 2007

Quantified Score

Hi-index 0.00

Visualization

Abstract

We present a detailed analysis of ion heating caused by thermal fluctuation noise in ion traps. The results of the analysis are used to estimate thermal noise ion heating rates for a variety of trap electrode configurations and materials, including recent scalable multiplexed planar ion trap proposals based on silicon VLSI technology. We find that minimizing thermal noise ion heating places severe constraints on the design and materials used for ion traps.