Test adequacy criterion based on coincidental correctness probability

  • Authors:
  • Jie Chen;Qian Li;Jianhua Zhao;Xuandong Li

  • Affiliations:
  • Nanjing University Jiangsu, China;Nanjing University Jiangsu, China;Nanjing University Jiangsu, China;Nanjing University Jiangsu, China

  • Venue:
  • Proceedings of the Second Asia-Pacific Symposium on Internetware
  • Year:
  • 2010

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Abstract

In recent years, coincidental correctness attracts many interests in testing area. Studies prove that it can adversely affect the effectiveness of testing. But current test adequacy criteria don't consider the effect of coincidental correctness. To address the problem, we design an approach to calculate the probability that an error in a given statement of the program under test is hidden by coincidental correctness. Such probability is used to measure the test adequacy on the statement. The test adequacy of a test suit is computed based on the adequacy on all the statement. A mutation analysis on five C programs is designed to compare the effectiveness of our adequacy criterion. The experimental results consistently approve our conjecture that such a test approach effectively quantizes the ability of test suite to find errors.