Topographic mapping of dissimilarity data

Authors:
Barbara Hammer;Andrej Gisbrecht;Alexander Hasenfuss;Bassam Mokbel;Frank-Michael Schleif;Xibin Zhu
Affiliations:
CITEC centre of excellence, Bielefeld University, Germany;CITEC centre of excellence, Bielefeld University, Germany;Computing Centre, TU Clausthal, Germany;CITEC centre of excellence, Bielefeld University, Germany;CITEC centre of excellence, Bielefeld University, Germany;CITEC centre of excellence, Bielefeld University, Germany
Venue:
WSOM'11 Proceedings of the 8th international conference on Advances in self-organizing maps
Year:
2011

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Abstract

Topographic mapping offers a very flexible tool to inspect large quantities of high-dimensional data in an intuitive way. Often, electronic data are inherently non-Euclidean and modern data formats are connected to dedicated non-Euclidean dissimilarity measures for which classical topographic mapping cannot be used. We give an overview about extensions of topographic mapping to general dissimilarities by means of median or relational extensions. Further, we discuss efficient approximations to avoid the usually squared time complexity.